Navigation links to pages

in EBSD explained:

 

Basics of EBSD

EBSD Experiments

Undertaking Experiments

 

Sample Preparation

 

Links to this section:

 

System Components
Pattern Formation
Interpreting the diffraction pattern
Calibration
Indexing
Band Intensity
Summary

 

Basics of EBSD

 

Pattern formation

 

For EBSD, a beam of electrons is directed at a point of interest on a tilted crystalline sample in the SEM (Figure 2).

 

The mechanism by which the diffraction patterns are formed is complex, but the following model describes the principal features. The atoms in the material inelastically scatter a fraction of the electrons with a small loss of energy to form a divergent source of electrons close to the surface of the sample. Some of these electrons are incident on atomic planes at angles which satisfy the Bragg equation:

 

(Equation 1)

 

where n is an integer, λ is the wavelength of the electrons, d  is the spacing of the diffracting plane, and θ is the angle of incidence of the electrons on the diffracting plane. These electrons are diffracted to form a set of paired large angle cones corresponding to each diffracting plane. When used to form an image on the fluorescent screen the regions of enhanced electron intensity between the cones produce the characteristic Kikuchi bands of the electron backscatter diffraction pattern (Figure 3).

 

Back | Next