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in EBSD
explained:
Basics of EBSD
EBSD Experiments
Undertaking Experiments
Sample Preparation
Links to this section:
System Components Pattern Formation Interpreting the diffraction pattern Calibration Indexing Band Intensity Summary
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Basics of EBSD
Pattern formation
For EBSD, a beam of electrons is directed at a point of interest on a tilted
crystalline sample in the SEM (Figure 2).
The mechanism by which the
diffraction patterns are formed is complex, but the following model
describes the principal features. The atoms in the material inelastically
scatter a fraction of the electrons with a small loss of energy to form a
divergent source of electrons close to the surface of the sample. Some of
these electrons are incident on
atomic planes at angles which satisfy the
Bragg equation:
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(Equation 1) |
where n is an integer, λ is the wavelength of the electrons, d is the
spacing of the diffracting plane, and θ is the angle of incidence of the
electrons on the diffracting plane. These electrons are diffracted to form a set
of paired large angle cones corresponding to each diffracting plane. When used
to form an image on the fluorescent screen the regions of enhanced electron
intensity between the cones produce the characteristic Kikuchi bands of the
electron backscatter
diffraction pattern (Figure 3).
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