Acquire Map

 

This screen starts the crystal orientation maps data collection.  Maps  can be collected up to a resolution width of 512 pixels.  A map can be collected from the full field of view, a rectangular region or a freely selected polygonal region.

 

During acquisition, the estimated time to completion is displayed together with an optional display of the current diffraction pattern or crystal orientation.   The pattern quality map or phase discrimination map is updated continually.

 

Maps are collected at up to 52 frames per second with each map pixel accurately registered to the beam position on the sample.

 

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EBSD Setup

 
This option specifies whether or not the pattern center position is adjusted as the beam moves across the sample.  In addition,  at the end of map collection,  options can be chosen to switch the microscope beam and filament off if the SEM can be externally controlled.