Misorientation and Coincident Site Lattices

The position of all grain boundaries are shown superimposed on the electron image or pattern quality map.  Boundaries can be allocated a color according to their range of misorientation angles.  The distribution of misorientation angles is shown on a histogram which is colored in the same way.  The length of boundaries in each range is calculated.

The position of coincident site lattices (CSL) can also be shown.  The boundaries are coloured according to the type of CSL.  The length of each type of CSL is shown.

Grain Size

A grain map can be formed from the crystal orientation map according to a selectable misorientation threshold which defines a grain.   The data from this grain map is displayed in a number of ways to show:

• Texture data plotted as one orientation point per grain.

• Stereological data including grain area, equivalent diameter and ASTM size.

• For each type of data above, a histogram is plotted, the average value calculated, a display of the counts in each histogram bin shown and an option to show in the map only grains of a certain size provided.

The coloured grain map can be overlaid on the electron image or pattern quality map to combine grain discrimination with morphological data.

A new crystal orientation map can be created from the grain map.