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Microstructural analysis with EBSD
Microstructure is important because it
determines many of the physical properties of materials. For example,
grain size can influence tensile strength and the properties of
grain boundaries can determine the way in which materials fracture.
Optical microscopy and scanning electron microscopy are both used to
examine microstructure. Polishing and chemical etching can reveal the
positions of grains and grain boundaries. However, these techniques may
not reveal all the grains. This is where EBSD
comes in - it measures crystal orientation and so must be able to show
unambiguously the position of all grains and grain boundaries.
EBSD
is used to form crystal
orientation maps by scanning the electron beam over the sample and measuring the
orientation from the diffraction pattern at each point. In a crystal
orientation map points with similar crystal orientations are shown in similar
colours. In these maps a grain is a region of the sample where the crystal orientation
is the same within a certain orientation angle tolerance. The maps
can be processed to show with certainty the position of all the grains and grain
boundaries.
EBSD is unique in that it
provides a link between microstructure and crystallography. It complements
conventional analysis techniques by providing definitive
information about the crystal orientations present in the sample.
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