3D column

Explore a 3rd dimension of the sample. 3D EBSD provides a new view of microstructure by complete description of all grains, grain boundaries, morphological & crystallographic relationships between grains and phases, and microtextures…

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Effect of sample tilt

The EBSD sample is usually tilted at approximately 70° relative to normal incidence of the electron beam to optimise both the contrast in the diffraction pattern and the fraction of electrons scattered from the sample.

For smaller tilt angles the contrast in the diffraction pattern decreases (Figure 8).

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Figure 8: Effect of tilt on silicon diffraction pattern

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