-
The camera integration time and gain
settings can now be optimised through an automated function. This
automatically changes the integration time if the camera resolution is
changed.
-
A new background removal mini
navigator is included which guides the user through the background removal
steps. Background division is now available.
-
The user can recalibrate or refine
the calibration using their sample at the time of analysis. This gives
improved solutions and angular accuracy of results.
-
The system calibration provides a
simple method to accurately determine the pattern centre.
-
The Hough transform resolution and
effective area can be altered to influence the angular accuracy, enhance the
solve rate and detect feint bands efficiently.
-
The time the solver spends matching
detected bands can be altered to maximise the system speed or to provide the
most accurate solutions.
-
The number of reflecting planes to be
considered by the solver can also be adjusted to improve solver accuracy for
enhanced phase discrimination.
-
Patterns can now be synthesised from
crystal structures for comparison with the acquired EBSP’s. The synthesised
pattern, crystal mimic and pole figure are interactive, displaying the
orientation of each pixel as the cursor is moved over the Crystal Orientation
Map.
-
The plotting of the pole figures and
inverse pole figures is now enhanced to include plotting with respect to times
random, contouring with a smoothing facility and optional contour lines.
-
IIt is now possible to acquire
Crystal Orientation Maps (COMs) at rates exceeding 50 pixels per second
(~185,000 measurements per hour). This is dependent on the camera and PC being
used.
-
AutoMate is now available for INCA
Crystal. This allows for the set up of macros, lines and grids of points for
multiple samples or areas of interest for the acquisition of COMs or other
orientation measurements.