CMOS Detector Range

Schematic showing the nose section of an Oxford Instruments CMOS EBSD detector

The Electron Backscatter Diffraction (EBSD) detector is perhaps the most critical component in any EBSD system. When the Symmetry EBSD detector was launched in 2017, it became the first commercially available EBSD detector to use a complementary metal-oxide semiconductor (CMOS) sensor, providing an unparalleled combination of exceptional analysis speed and diffraction pattern resolution. In 2018, Oxford Instruments subsequently launched 2 additional EBSD detectors to complete its CMOS detector range, the C-Nano and the C-Swift. All 3 detectors benefit from market-leading sensitivity, delivered by their unique fibre-optic lens system and customised CMOS sensors. You can read more about the importance of fibre optics and sensitivity here.

The latest release of the Symmetry S3 detector further increases the maximum analysis speed to > 5700 indexed patterns per second (pps), enabling routine characterisation of materials in just a matter of seconds, with significant improvements also made to the C-series detectors with the recent launch of the C-Nano+ and C-Swift+. Read about the key aspects of each detector, below, or refer to the main Oxford Instruments NanoAnalysis product webpages.

The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a range of innovative design features. Highlights include:

  • Guaranteed indexing speeds in excess of 5700 pps
  • 1244 x 1024 pixel resolution – ideal for high angular resolution (HR) EBSD
  • Unique fibre-optic coupling with sub-pixel distortion
  • Extreme sensitivity, benefiting all types of analysis
  • Software controlled detector tilting

Find out more on the Symmetry S3 product page.

fibre-optic coupled Symmetry S3 EBSD Detector

See for yourself the versatility and performance of the previous generation Symmetry S2 detector in this promotional video.

The C-Nano+ is a versatile and effective EBSD detector. The innovative technology that has helped the Symmetry detector make such an impact has been implemented in the C-Nano+, delivering class-leading performance at an entry level. The C-Nano+ is suited to characterising all types of samples, but its high pixel resolution makes it ideal for detailed strain analyses as well as for routine work on complex and challenging materials. Highlights include:

  • Full 1244 x 1024 pixel resolution patterns – ideal for high resolution EBSD
  • Class-leading acquisition speed of 600 pps
  • Fibre-optics delivering extreme sensitivity for low energy and low current analyses
  • Distortion free images
  • Contactless collision avoidance system

Find out more on the C-Nano+ product page

fibre-optic coupled C-Nano+ EBSD detector

The C-Swift+ is the newest member of our CMOS detector family designed for routine materials analysis and high throughput sample characterisation.

The C-Swift+ benefits from many of the features that have made Symmetry such a groundbreaking EBSD detector including, of course, a customised CMOS sensor designed for EBSD. Highlights include:

  • Guaranteed indexing speeds of 2000 pps
  • 622 x 512 pixel EBSPs at 250 pps
  • Fibre-optics delivering extreme sensitivity for low energy and low current analyses
  • Distortion free images
  • Contactless collision avoidance system

Find out more on the C-Swift+ product page

fibre-optic coupled C-Swift+ EBSD Detector